Subject: Re: ffs panic with 1.5C (19/11/2000)
To: Brett Lymn <blymn@baesystems.com.au>
From: Darren Reed <darrenr@reed.wattle.id.au>
List: tech-kern
Date: 11/12/2000 21:43:17 
In some email I received from Brett Lymn, sie wrote:
> 
> Once upon a time I did have an algorithm that was supposed to
> thoroughly test out DRAM, it was supposed to be based on the device
> characteristics so it could pick up DRAM type faults.  I can try and
> dig up a copy if anyone is interested.

Count me in.